{"id":398805,"date":"2024-10-20T04:38:47","date_gmt":"2024-10-20T04:38:47","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-35-2010-3\/"},"modified":"2024-10-26T08:26:25","modified_gmt":"2024-10-26T08:26:25","slug":"ieee-c62-35-2010-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-35-2010-3\/","title":{"rendered":"IEEE C62.35-2010"},"content":{"rendered":"
Revision Standard – Superseded. Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and\/or parallel diode chips.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | IEEE Std C62.35-2010\/Cor 1-2018 Front Cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Important Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 8.8.1 Rated forward surge current test method (See Figure 8) <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Back Cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components<\/b><\/p>\n |