{"id":395079,"date":"2024-10-20T04:17:09","date_gmt":"2024-10-20T04:17:09","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61788-172021-tc\/"},"modified":"2024-10-26T08:02:03","modified_gmt":"2024-10-26T08:02:03","slug":"bs-en-iec-61788-172021-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61788-172021-tc\/","title":{"rendered":"BS EN IEC 61788-17:2021 – TC"},"content":{"rendered":"

IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV<\/span> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. – Jcd: from 200 A\/m to 32 kA\/m (based on results, not limitation). – Measurement resolution: 100 A\/m (based on results, not limitation).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\n30451912 <\/td>\n<\/tr>\n
69<\/td>\nA-30391555 <\/td>\n<\/tr>\n
70<\/td>\nundefined <\/td>\n<\/tr>\n
73<\/td>\nAnnex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
75<\/td>\nCONTENTS <\/td>\n<\/tr>\n
77<\/td>\nFOREWORD <\/td>\n<\/tr>\n
79<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
81<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
82<\/td>\n4 Requirements <\/td>\n<\/tr>\n
83<\/td>\n5 Apparatus
5.1 Measurement equipment
Figures
Figure 1 \u2013 Diagram for an electric circuit usedfor inductive Jc measurement of HTS films <\/td>\n<\/tr>\n
84<\/td>\n5.2 Components for inductive measurements
Figure 2 \u2013 Illustration showing techniques to press the sample coil to HTS films <\/td>\n<\/tr>\n
85<\/td>\n6 Measurement procedure
6.1 General
6.2 Determination of the experimental coil coefficient
Figure 3 \u2013 Example of a calibration wafer used to determine the coil coefficient <\/td>\n<\/tr>\n
86<\/td>\nFigure 4 \u2013 Illustration of the sample coil and the magnetic field during measurement <\/td>\n<\/tr>\n
87<\/td>\nFigure 5 \u2013 Illustration of the sample coil and its magnetic field generation
Tables
Table 1 \u2013 Specifications and theoretical coil coefficients k of sample coils <\/td>\n<\/tr>\n
89<\/td>\n6.3 Measurement of Jc in sample films
6.4 Measurement of Jc with only one frequency
Figure 6 \u2013 E-J characteristics measured by a transport methodand the U3 inductive method <\/td>\n<\/tr>\n
90<\/td>\n6.5 Examples of the theoretical and experimental coil coefficients
Figure 7 \u2013 Illustration of coils 1 and 3 in Table 2
Table 2 \u2013 Specifications and coil coefficients of typical sample coils <\/td>\n<\/tr>\n
91<\/td>\n7 Uncertainty in the test method
7.1 Major sources of systematic effects that affect the U3 measurement
Figure 8 \u2013 The coil-factor function F(r) = 2H0\/I0 calculated for the three coils <\/td>\n<\/tr>\n
92<\/td>\n7.2 Effect of deviation from the prescribed value in the coil-to-film distance
Figure 9 \u2013 The coil-to-film distance Z1 dependenceof the theoretical coil coefficient k <\/td>\n<\/tr>\n
93<\/td>\n7.3 Uncertainty in the experimental coil coefficient and the obtained Jc
7.4 Effects of the film edge
7.5 Specimen protection <\/td>\n<\/tr>\n
94<\/td>\n8 Test report
8.1 Identification of test specimen
8.2 Report of Jc values
8.3 Report of test conditions <\/td>\n<\/tr>\n
95<\/td>\nAnnex A (informative) Additional information relating to Clauses 1 to 8 <\/td>\n<\/tr>\n
97<\/td>\nFigure A.1 \u2013 Illustration of the sample coil andthe magnetic field during measurement <\/td>\n<\/tr>\n
99<\/td>\nFigure A.2 \u2013 U3 and U3\/I0 plotted against I0 in a YBCO thin film measured in applied DC magnetic fields, and the scaling observed when normalized by Ith (insets)
Figure A.3 \u2013 Example of the normalized third-harmonicvoltages (U3\/fI0) measured with various frequencies <\/td>\n<\/tr>\n
101<\/td>\nAnnex B (informative) Optional measurement systems <\/td>\n<\/tr>\n
102<\/td>\nFigure B.1 \u2013 Schematic diagram for the variable-RL-cancel circuit
Figure B.2 \u2013 Diagram for an electrical circuit used for the two-coil method <\/td>\n<\/tr>\n
103<\/td>\nFigure B.3 \u2013 Harmonic noises arising from the power source
Figure B.4 \u2013 Noise reduction using a cancel coil with a superconducting film <\/td>\n<\/tr>\n
104<\/td>\nFigure B.5 \u2013 Normalized harmonic noises (U3\/fI0) arising from the power source
Figure B.6 \u2013 Normalized noise voltages after the reductionusing a cancel coil with a superconducting film <\/td>\n<\/tr>\n
105<\/td>\nFigure B.7 \u2013 Normalized noise voltages after the reductionusing a cancel coil without a superconducting film
Figure B.8 \u2013 Normalized noise voltages with the two-coil system shown in Figure B.2 <\/td>\n<\/tr>\n
106<\/td>\nAnnex C (informative) Evaluation of the uncertainty <\/td>\n<\/tr>\n
107<\/td>\nTable C.1 \u2013 Uncertainty budget table for the experimental coil coefficient k\u2032 <\/td>\n<\/tr>\n
109<\/td>\nTable C.2 \u2013 Examples of repeated measurements of Jc and n-values <\/td>\n<\/tr>\n
111<\/td>\nFigure C.1 \u2013 Effect of the coil position against a superconductingthin film on the measured Jc values <\/td>\n<\/tr>\n
112<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Tracked Changes. Superconductivity – Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2022<\/td>\n116<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":395084,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[285,2641],"product_tag":[],"class_list":{"0":"post-395079","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-17-220-20","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/395079","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/395084"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=395079"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=395079"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=395079"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}