{"id":233973,"date":"2024-10-19T15:15:34","date_gmt":"2024-10-19T15:15:34","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62951-62019\/"},"modified":"2024-10-25T09:46:57","modified_gmt":"2024-10-25T09:46:57","slug":"bs-iec-62951-62019","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62951-62019\/","title":{"rendered":"BS IEC 62951-6:2019"},"content":{"rendered":"
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4 Atmospheric conditions for evaluation and conditioning <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5 In situ measurements using 2-point probe method 5.1 General 5.2 Sample preparation 5.3 Test methods 5.3.1 Test apparatus Figures Figure 1 \u2013 Possible electric connection of 2-point probe measurement <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5.3.2 Measurement and data analysis 5.4 Report of results Figure 2 \u2013 Gauge section of bending test <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6 Uniformity measurement using 4-point probe method 6.1 General 6.2 Test methods 6.2.1 Test apparatus 6.2.2 Measurement and data analysis <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.3 Report of results Figure 3 \u2013 Example of measuring positions Figure 4 \u2013 Direction of bending and collinear probes <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 7 Anisotropic measurement using the Montgomery method 7.1 General 7.2 Test methods 7.2.1 Test apparatus 7.2.2 Measurement and data analysis <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 7.3 Report of results Figure 5 \u2013 Resistance measurement with the Montgomery method <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex A (informative) Bending tests Figure A.1 \u2013 Two common bending test methods for flexible substrates <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Annex B (informative) 4-point probe measurements B.1 General B.2 Correction for finite sample size Figure B.1 \u2013 Schematic diagram of 4-point probe <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Figure B.2 \u2013 Correction factor of square sample depending on length\/probe spacing [2] <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Figure B.3 \u2013 Correction factor depending on measuring position when collinear probes are directed vertically Figure B.4 \u2013 Correction factor depending on measuring position when collinear probes are directed horizontally <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Figure B.5 \u2013 Correction factor, f depending on measuring positions anddirection of collinear probes <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | B.3 Correction factors accounting for finite size probe tips Figure B.6 \u2013 Example of probe with a finite contact diameter (e.g. 2mm) comparable to inter-distance between probes (e.g. 5 mm) <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Figure B.7 \u2013 Dimensional sketch of probe with a finite contact diameter <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex C (informative) Montgomery method C.1 General C.2 Sample preparation Figure C.1 \u2013 Possible contact placements of square or rectangular sample <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | C.3 Measurement of sheet resistance of isotropic sample Figure C.2 \u2013 Correction factors for finite contact size on resistivity measurement [4] <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | C.4 Measurement of anisotropic sheet resistance Figure C.3 \u2013 Resistance measurement of Montgomery method <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Semiconductor devices. Flexible and stretchable semiconductor devices – Test method for sheet resistance of flexible conducting films<\/b><\/p>\n |