31.080.01 - Semiconductor devices in general
Showing 513–525 of 525 results
-
ASTM-E722 2004
E722-04e1 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic…
-
ASTM-E722 2004
E722-04e2 Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic…
-
ASTM-E722 2009
E722-09 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
-
ASTM-E722 2009
E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
-
ASTM-E431:2002 Edition
E431-96(2002) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices Published By Publication…
-
ASTM-E427 2000
E427-95(2000) Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode) Published…
-
ASTM-F1893:2011 Edition(Redline)
F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Redline) Published…
-
ASTM-F1893:2011 Edition
F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices Published By…
-
ASTM-F1190:1993 Edition
F1190-93 Standard Guide for Neutron Irradiation of Unbiased Electronic Components Published By Publication Date Number…
-
ASTM-E722 2009(Redline)
E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
-
ASTM-E431:2007 Edition
E431-96(2007) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices Published By Publication…
-
ASTM-E427 2006
E427-95(2006) Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) Published By…
-
ASTM-E1161:2009 Edition
E1161-09 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components Published By Publication Date…