31.080.01 - Semiconductor devices in general
Showing 481–496 of 525 results
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ASTM-F1893:2018 Edition(Redline)
F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Redline) Published…
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ASTM-F1211:2001 Edition
F1211-89(2001) Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007) Published By Publication Date…
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ASTM-F78 2002
F78-97(2002) Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards…
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ASTM-F72 2017
F72-17e1 Standard Specification for Gold Wire for Semiconductor Lead Bonding Published By Publication Date Number…
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ASTM-E722 2019(Redline)
E722-19 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-E722 2019
E722-19 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-F1893:2018 Edition
F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices Published By…
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ASTM-F1892:2018 Edition
F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Published By…
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ASTM-F1192:2018 Edition
F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
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ASTM-E431:2016 Edition
E431-96(2016) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices Published By Publication…
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ASTM-E722 2014
E722-14 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-E1161:2014 Edition
E1161-09(2014) Standard Practice for Radiologic Examination of Semiconductors and Electronic Components Published By Publication Date…
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ASTM-F1190:1999 Edition
F1190-99 Standard Guide for Neutron Irradiation of Unbiased Electronic Components Published By Publication Date Number…
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ASTM-F1190:2005 Edition
F1190-99(2005) Standard Guide for Neutron Irradiation of Unbiased Electronic Components Published By Publication Date Number…
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ASTM-F1192:2000 Edition
F1192-00 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
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ASTM-F1192:2006 Edition
F1192-00(2006) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…