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31.080.01 - Semiconductor devices in general

Showing 433–448 of 525 results

  • BS EN 60749-13:2002

    BS EN 60749-13:2002

    Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…

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  • BS EN 60749-34:2004

    BS EN 60749-34:2004

    Semiconductor devices. Mechanical and climatic test methods – Power cycling Published By Publication Date Number…

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  • BS EN 60749-24:2004

    BS EN 60749-24:2004

    Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased HAST Published By…

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  • BS EN 60749-20:2003

    BS EN 60749-20:2003

    Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic-encapsulated SMDs to the combined…

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  • BS EN 60749-8:2003

    BS EN 60749-8:2003

    Semiconductor devices. Mechanical and climatic test methods – Sealing Published By Publication Date Number of…

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  • BS EN 60191-6:2004:2005 Edition

    BS EN 60191-6:2004:2005 Edition

    Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…

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  • BS EN 60749-33:2004

    BS EN 60749-33:2004

    Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased autoclave Published By…

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  • BS EN 60749-25:2003

    BS EN 60749-25:2003

    Semiconductor devices. Mechanical and climatic test methods – Temperature cycling Published By Publication Date Number…

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  • BS EN 60749-14:2003

    BS EN 60749-14:2003

    Semiconductor devices. Mechanical and climatic test methods – Robustness of terminations (lead integrity) Published By…

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  • BS EN 60749-12:2002

    BS EN 60749-12:2002

    Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…

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  • BS EN 60749-9:2002

    BS EN 60749-9:2002

    Semiconductor devices. Mechanical and climatic test methods – Permanence of marking Published By Publication Date…

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  • BS EN 60749-4:2002

    BS EN 60749-4:2002

    Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress…

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  • BS EN 60749-2:2002

    BS EN 60749-2:2002

    Semiconductor devices. Mechanical and climatic test methods – Low air pressure Published By Publication Date…

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  • BSI PD ES 59008-5-3:2001

    BSI PD ES 59008-5-3:2001

    Data requirements for semiconductor die. Particular requirements and recommendations for die types – Minimally-packaged die…

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  • BS EN 60191-6-4:2003

    BS EN 60191-6-4:2003

    Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface…

    $102.76 Add to cart
  • BS EN 60749-21:2005

    BS EN 60749-21:2005

    Semiconductor devices. Mechanical and climatic test methods – Solderability Published By Publication Date Number of…

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