31.080.01 - Semiconductor devices in general
Showing 433–448 of 525 results
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BS EN 60749-13:2002
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
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BS EN 60749-34:2004
Semiconductor devices. Mechanical and climatic test methods – Power cycling Published By Publication Date Number…
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BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased HAST Published By…
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BS EN 60749-20:2003
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic-encapsulated SMDs to the combined…
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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods – Sealing Published By Publication Date Number of…
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BS EN 60191-6:2004:2005 Edition
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased autoclave Published By…
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BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods – Temperature cycling Published By Publication Date Number…
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BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods – Robustness of terminations (lead integrity) Published By…
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BS EN 60749-12:2002
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
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BS EN 60749-9:2002
Semiconductor devices. Mechanical and climatic test methods – Permanence of marking Published By Publication Date…
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BS EN 60749-4:2002
Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress…
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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods – Low air pressure Published By Publication Date…
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BSI PD ES 59008-5-3:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types – Minimally-packaged die…
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BS EN 60191-6-4:2003
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface…
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BS EN 60749-21:2005
Semiconductor devices. Mechanical and climatic test methods – Solderability Published By Publication Date Number of…