31.080.01 - Semiconductor devices in general
Showing 401–416 of 525 results
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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using a…
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BS EN 60191-6-20:2010
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BS IEC 60747-14-1:2010
Semiconductor devices – Semiconductor sensors. Generic specification for sensors Published By Publication Date Number of…
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BS EN 62418:2010
Semiconductor devices. Metallization stress void test Published By Publication Date Number of Pages BSI 2010…
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BS EN 62415:2010
Semiconductor devices. Constant current electromigration test Published By Publication Date Number of Pages BSI 2010…
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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices – Measurement methods of the package warpage at elevated temperature…
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BS EN 60749-20:2009 2010
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic encapsulated SMDs to the…
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BS EN 60191-6:2009:2010 Edition
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BS IEC 60747-14-5:2010
Semiconductor devices – Semiconductor sensors. PN-junction semiconductor temperature sensor Published By Publication Date Number of…
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BS EN 60191-6-17:2011
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BSI DD IEC/PAS 62483:2006 2007
Test method for measuring whisker growth on tin and tin alloy surface finishes Published By…
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BS IEC 60747-16-2:2001:2008 Edition
Semiconductor devices – Microwave integrated circuits. Frequency prescalers Published By Publication Date Number of Pages…
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BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices – Semiconductor accelerometers Published By Publication Date Number of Pages BSI…
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BS EN 60749-37:2008
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using an…
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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods – Acoustic microscopy for plastic encapsulated electronic components…
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BS IEC 60191-1:2007
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…