31.080.01 - Semiconductor devices in general
Showing 353–368 of 525 results
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods – Electrostatic discharge (ESD) sensitivity testing. Human body…
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BS IEC 60747-18-2:2020
Semiconductor devices – Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package…
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BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices – Test method for thermal characteristics of flexible…
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BSI 18/30355426 DC:2018 Edition
BS EN 62830-5. Semiconductor devices. Semiconductor devices for energy harvesting and generation – Part 5.…
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BS IEC 60747-14-10:2019
Semiconductor devices – Semiconductor sensors. Performance evaluation methods for wearable glucose sensors Published By Publication…
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BSI 19/30350992 DC:2019 Edition
BS EN IEC 60749-41. Semiconductor devices. Mechanical and climatic test methods – Part 41. Standard…
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BS EN 60749-5:2017
Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life test Published…
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BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices – Coding system and classification into forms of package outlines…
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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods – Permanence of marking Published By Publication Date…
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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods – External visual examination Published By Publication Date…
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature Published By Publication…
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BS IEC 60747-9:2019
Semiconductor devices – Discrete devices. Insulated-gate bipolar transistors (IGBTs) Published By Publication Date Number of…
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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress…
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BS IEC 62047-29:2017:2018 Edition
Semiconductor devices. Micro-electromechanical devices – Electromechanical relaxation test method for freestanding conductive thin-films under room…
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BS IEC 60191-2:1966+A21:2020
Mechanical standardization of semiconductor devices – Dimensions Published By Publication Date Number of Pages BSI…