IEC PAS 62483:2006
$63.70
Test method for measuring whisker growth on tin and tin alloy surface finishes
Published By | Publication Date | Number of Pages |
IEC | 2006-09-12 | 34 |
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Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document
Published Code | IEC |
---|---|
Published By | International Electrotechnical Commission |
Publication Date | 2006-09-12 |
Pages Count | 34 |
Language | English |
Edition | 1.0 |
File Size | 1.8 MB |
ICS Codes | 31.080.01 - Semiconductor devices in general |
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