IEC 62860:2013

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Test methods for the characterization of organic transistors and materials

Published By	Publication Date	Number of Pages
IEC	2013-08-05	28

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Categories: 07.030 - Physics. Chemistry, 07.120 - Nanotechnologies, IEC

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Description

IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.

Additional information

Published Code	IEC
Published By	International Electrotechnical Commission
Publication Date	2013-08-05
Pages Count	28
Language	English
Descriptors	electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor
Edition	1.0
File Size	1.1 MB
ICS Codes	07.030 - Physics. Chemistry 07.120 - Nanotechnologies

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IEC 62860:2013

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