BSI PD IEC TS 62607-6-3:2020
$142.49
Nanomanufacturing. Key control characteristics – Graphene-based material. Domain size: substrate oxidation
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 26 |
This part of IEC TS 62607 establishes a standardized method to determine the structural key control characteristic
-
domain size
for films consisting of graphene grown by chemical vapour deposition (CVD) on copper by
-
substrate oxidation.
It provides a fast, facile and reliable method to evaluate graphene domains formed on copper foil or copper film for understanding the effect of the graphene domain size on properties of graphene and enhancing the performance of high speed, flexible, and transparent devices using CVD graphene.
-
The domain size determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1. Domain density is an equivalent measure.
-
The domain size as derived by this method is defined as the mean value of size of the domains in the observed area specified by supplier in terms of cm2 or µm2.
-
The method is applicable for graphene grown on copper by CVD. The characterization is done on the copper foil before transfer to the final substrate.
-
As the method is destructive, the samples cannot be re-launched into the fabrication process.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 4 | CONTENTS |
| 6 | FOREWORD |
| 8 | INTRODUCTION Figures Figure 1 – Applications of graphene |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | 3.1 General terms 3.2 Graphene related terms |
| 11 | 3.3 Key control characteristics measured in accordance with this document 4 General 4.1 Measurement principle |
| 12 | 4.2 Sample preparation method Figure 2 – Schematics for oxidation of copper foil through the graphene boundaries |
| 13 | 4.3 Measurement system Figure 3 – Optical image of the graphene domains on Cu foil Figure 4 – Schematic view of oxidation system |
| 14 | 4.4 Description of measurement equipment/apparatus 4.5 Calibration standards 4.6 Ambient conditions during measurement 5 Measurement procedure 5.1 Calibration of measurement equipment 5.2 Detailed protocol of the measurement procedure 5.2.1 General Figure 5 – Optical images of graphene/Cu after oxidationand analysed grain size distribution |
| 15 | 5.2.2 Example 6 Results to be reported 6.1 General 6.2 Product/sample identification 6.3 Test conditions Figure 6 – Example of domain size analysis |
| 16 | 6.4 Measurement specific information 6.5 Test results |
| 17 | Annex A (informative)Worked example A.1 Example Figure A.1 – Photograph of graphene/Cu foil (7cm × 7 cm) forgraphene grown at 1 050 °C by CVD with CH4 |
| 18 | Figure A.2 – SEM image of graphene/Cu after oxidationat the points as specified in Figure A.6 Figure A.3 – Measuring graphene domain size of Figure A.2 using Image J |
| 19 | Figure A.4 –Domain size distribution and averagedomain size of graphene shown in Figure A.2 |
| 20 | A.2 Sampling plan Figure A.5 – Accumulative domain size distribution shown in Figure A.4 and average domain size of graphene measured at 9 points shown in Figure A.6 Figure A.6 – Location of the analysed area on the sample |
| 21 | A.3 Format of the test report Tables Table A.1 – Product identification (in accordance with IEC 62565-3-1) Table A.2 – General material description (in accordance with IEC 62565-3-1) Table A.3 – Measurement related information |
| 22 | Table A.4 – KCC measurement results |
| 23 | Annex B (informative)Alternative methods for evaluating graphene domains and defects Figure B.1 – Typical methods for observing graphene domain and grain boundaries |
| 24 | Bibliography |
