BSI PD IEC TS 62607-5-4:2022
$102.76
Nanomanufacturing. Key control characteristics – Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)
Published By | Publication Date | Number of Pages |
BSI | 2022 | 22 |
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
4 | CONTENTS |
5 | FOREWORD |
7 | INTRODUCTION |
8 | 1 Scope 2 Normative references 3 Terms and definitions |
9 | Figures Figure 1 – Definition of band gap energy |
11 | 4 Abbreviated terms 5 Environmental conditions 6 Test sample 6.1 General 6.2 Size of test sample 7 Testing method and test apparatus 7.1 General |
12 | 7.2 Detector Figure 2 – Schematic showing TEM and EELS system |
13 | 7.3 Test procedure 7.3.1 Transmission electron microscope alignment 7.3.2 Scanning transmission electron microscope alignment 7.4 Measurement Figure 3 – Apparatus for the measurement of band gap energy by using electron energy loss spectroscopy |
14 | 8 Data analysis 8.1 Band gap determination Figure 4 – Setting for spectrum imaging |
15 | 8.2 Report of the results Figure 5 – Normalized spectrum of log scale Figure 6 – Band gap measurement method using linear fitting |
17 | Annex A (informative)Band gap measurement of WO3 thin film on PET Figure A.1 – Measurement of band gap of WO3 by STEM-EELS |
18 | Table A.1 – Example of a report for the sample in Figure A.1 |
19 | Annex B (informative)Band gap measurement of SiNx thin-film multilayers Figure B.1 – Band gap measurement result of multilayer thin films Table B.1 – Band gap data of SiNx |
20 | Bibliography |