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BSI 24/30485839 DC 2024

$13.70

BS EN IEC 61987-41 IEC 61987 – Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange

Published By Publication Date Number of Pages
BSI 2024 24
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PDF Catalog

PDF Pages PDF Title
7 FOREWORD
9 INTRODUCTION
11 1 Scope
2 Normative references
3 Terms and definitions
12 3.1 Dynamic property
3.2 List of Properties for Dynamic Data (LOPD)
4 General
4.1 Characterization scheme
4.2 OLOP, DLOP and LOPD
13 4.3 Cardinality and polymorphism
14 5 Operating List of Properties (OLOP)
5.1 Generic block structure
5.2 Matrix of components/measurands
5.2.1 Chemical component/measurand
5.2.1.1 Process analyser measurands
15 5.3 Measuring or control point
5.4 Base conditions
5.5 Physical properties at sampling point
5.6 Operating conditions for device design
5.7 Process equipment
5.8 Physical location
5.8.1 General
5.8.2 Available power supply
5.8.3 Purge gas supply
16 5.8.4 Process criticality classification
5.8.5 Area classification
5.9 Auxiliary media
6 Device List of Properties (DLOP)
6.1 Basic structure
6.1.1 General
6.1.2 Generic block structure
18 6.1.3 Relationship to IEC 61987-10F
7 LOPD with dynamic properties for condition monitoring
7.1 General
19 7.2 Measurement variables
7.3 General device variables/status
7.4 Specific device variables/status/condition monitoring
7.5 General device parameters and variables
7.6 General functions
8 Additional aspects
20 Annex A (informative) Device Type Dictionary – Classification of process analysers
24 Bibliography
BSI 24/30485839 DC 2024
$13.70