BSI 17/30366375 DC:2017 Edition
$13.70
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) – Part 1. Fast BTI Test method
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 16 |
| Status | Definitive |
|---|---|
| Pages | 16 |
| Publication Date | 2017-11-30 |
| Standard Number | 17/30366375 DC |
| Title | BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) – Part 1. Fast BTI Test method |
| Descriptors | Transistors, Metal oxide semiconductors, Electronic equipment and components, Temperature, Semiconductors, Voltage measurement, Semiconductor devices, Testing conditions |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.30 - Transistors |
