BS ISO 20903:2019
$142.49
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
Published By | Publication Date | Number of Pages |
BSI | 2019 | 26 |
This document specifies the necessary information required in a report of analytical results based on measurements of the intensities of peaks in Auger electron and X-ray photoelectron spectra. Information on methods for the measurement of peak intensities and on uncertainties of derived peak areas is also provided.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
6 | Foreword |
7 | Introduction |
9 | 1 Scope 2 Normative references 3 Terms and definitions 4 Symbols and abbreviated terms |
10 | 5 Methods for peak-intensity determination — direct spectrum 5.1 General |
11 | 5.2 Selection and subtraction of an inelastic background |
12 | 5.3 Measurement of peak intensity 5.3.1 Measurement of peak height 5.3.2 Measurement of peak area |
13 | 5.4 Measurement of a peak intensity with computer software 5.5 Measurement of peak intensities for a spectrum with overlapping peaks |
14 | 5.6 Uncertainty in measurement of peak area |
15 | 6 Methods for peak intensity determination — Auger-electron differential spectrum 6.1 General 6.2 Measurement of Auger-electron differential intensity |
16 | 6.3 Uncertainties in measurement of Auger-electron differential intensity |
18 | 7 Reporting of methods used to measure peak intensities 7.1 General requirements 7.2 Methods used to determine peak intensities in direct spectra 7.2.1 Intensity measurement for a single peak, as described in 5.2 and 5.3 |
19 | 7.2.2 Intensity measurements from peak fitting, as described in 5.4 and 5.5 7.3 Methods used to obtain and determine peak intensities in Auger-electron differential spectra 7.3.1 Method used to obtain differential spectra 7.3.2 Method used to determine peak intensities, as described in 6.2 |
20 | Annex A (informative) Instrumental effects on measured intensities |
21 | Annex B (informative) Useful integration limits for determination of peak intensities in XPS spectra |
23 | Bibliography |