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BS IEC 61649:1997

BS IEC 61649:1997

$102.76

Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

Published By Publication Date Number of Pages
BSI 1997 16
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Status

Withdrawn
Title

Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Publisher

BSI
Committee

DS/1
Pages

16
Publication Date

1997-09-15
Withdrawn Date

2009-02-28
Replaced By

BS EN 61649:2008
ISBN

0 580 28098 5
Standard Number

BS IEC 61649:1997
Identical National Standard Of

IEC 61649:1997
Descriptors

Statistical methods of analysis, Statistical distribution, Formulae (mathematics), Electrical equipment, Electronic equipment and components, Statistical tolerance intervals, Accuracy, Reliability, Normal distribution, Estimation, Electrical components, Statistical testing, Failure (quality control), Confidence limits
ICS Codes 29.020 - Electrical engineering in general

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BS IEC 61649:1997
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