BS EN 60749-30:2005+A1:2011
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Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior to reliability testing
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 16 |
| Status | Withdrawn |
|---|---|
| Title | Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior to reliability testing |
| Publisher | BSI |
| Committee | EPL/47 |
| Pages | 16 |
| Publication Date | 2011-09-30 |
| Withdrawn Date | 2020-09-30 |
| Replaced By | BS EN IEC 60749-30:2020 |
| ISBN | 978 0 580 68749 5 |
| Standard Number | BS EN 60749-30:2005+A1:2011 |
| Identical National Standard Of | EN 60749-30:2005/A1:2011, IEC 60749-30:2005, IEC 60749-30:2005/AMD1:2011 |
| Descriptors | Semiconductor devices, Electronic equipment and components, Mechanical testing, Performance testing, Specimen preparation, Environmental testing, Reliability, Climate, Surface mounting devices, Integrated circuits |
| Amends | 09/30208070 DC, BS EN 60749-30:2005 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
