| Descriptors |
Breakdown voltage, Approval testing, Visual inspection (testing), Pulse generators, Accelerated testing, Frequency measurement, Specification (approval), Power measurement (electric), Statistical quality control, Quality factor, Avalanche diodes, Impedance measurement, Performance testing, Adhesion tests, Electrical testing, Attenuation, Time measurement, Variable capacitors, Environmental testing, Receivers, Transistors, Test equipment, Sampling methods, Quality assurance systems, Flammability, Testing conditions, Ratings, Detail specification, Field-effect transistors, Thermal-cycling tests, Thyristors, Marking, Qualification approval, Charge measurement, Detectors (circuits), Voltage measurement, Current measurement, Assessed quality, Quality control, Pulse circuits, Sensitivity, Defects, Semiconductor devices, Solvent-resistance tests, Rated voltage, Fire tests, Capacitance measurement, Colour codes, Noise (spurious signals), Electrical measurement, Temperature measurement, Endurance testing, Power factor, Rectifier diodes, Inspection, Encapsulated, Inductance measurement, Power gain, Leak tests, Microwaves, Microwave devices, Definitions, Radiofrequencies, Resistance measurement, Electronic equipment and components, Circuits, Mechanical testing, Thermal testing, Oscillators, Suppressors, Semiconductor diodes, Diodes
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